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Unusually long carrier lifetime in a Mott insulator revealed by time-resolved Photoemission Electron Microscopy

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Abstract

Mott insulators display puzzling insulator to metal transitions under electric field. We study here the Mott insulator GaV4S8 using time-resolved Photoemission Electron Microcopy and reveal unusually long carrier lifetimes, supporting the mechanism of electronic avalanche.

© 2020 The Author(s)

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