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Thermal and Loss Characterization of Mechanically Released Whispering Gallery Mode Waveguide Resonators

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Abstract

We present an empirical methodology for thermally characterizing and determining absorption and scattering losses in released ring whisper gallery mode optical resonators. We used the methodology to deduce absorption and scattering contributions in Q = 308,000 silicon nitride resonators coupled to on-chip waveguides.

© 2021 The Author(s)

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