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Conferences > LTST > 2012 > STh4A > STh4A.17

Material structure detection based on terahertz time domain spectroscopy imaging

Xaioguang Zhu, Jun Cao, Dongwen Zhang, and Jianmin Yuan

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Abstract

The impurities sandwiched between two plastic plates and the inside layout of the integrate circuit chip is mapped by terahertz time domain spectroscopy. They are both clearly showed in the amplitude and phase mapping of the transmitted terahertz waves.

© 2012 Optical Society of America

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