Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

First Born model for reflection-mode Fourier ptychographic microscopy

Not Accessible

Your library or personal account may give you access

Abstract

We validate a first Born approximation based model for Reflection-mode Fourier ptychography under the semi-infinite boundary condition. Our model enables optical thickness and absorption recovery with enhanced resolution from thin samples.

© 2018 The Author(s)

PDF Article
More Like This
Wide-field, high-resolution reflection-mode Fourier ptychographic microscopy

Hao Wang, Jiabei Zhu, Jangwoon Sung, Guorong Hu, Joseph Greene, Yunzhe Li, Seungbeom Park, Wookrae Kim, Myungjun Lee, Yusin Yang, and Lei Tian
HW3C.2 Digital Holography and Three-Dimensional Imaging (DH) 2023

Reflective Fourier Ptychographic Microscopy Using the Scheimpflug Scheme

Mojde Hasanzade, Nazabat Hussain, Dag Werner Breiby, and Muhammad Nadeem Akram
JTu3A.142 CLEO: Applications and Technology (CLEO:A&T) 2021

A deep-learning approach for high-speed Fourier ptychographic microscopy

Thanh Nguyen, Yujia Xue, Waleed Tahir, Yunzhe Li, Lei Tian, and George Nehmetallah
JTh3A.6 3D Image Acquisition and Display: Technology, Perception and Applications (3D) 2018

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.