Abstract
Three-dimensional fractals with Menger sponge and its modified structures were fabricated with 10 vol.%TiO2-SiO2 dispersed epoxy by a CAD/CAM stereolithography. The transmission and right angle scattering spectra of microwave showed the localization or confinement at specific frequencies of GHz range in these 3D fractal structures. Such localizations were confirmed by the measurement and simulation of the electric field distributions at the inner and outer space of fractals as well. The localization frequencies measured showed good agreements with the calculated ones using the empirical equation which was proposed to predict localized frequencies in Menger sponge fractals. These results suggest that the localization occurs due to electromagnetic resonances in 3D fractal structures with the self-similar contrast of dielectric constant.
© 2006 Optical Society of America
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