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Near-field characterization of photonic nanostructures -from hot spot imaging to superlens studies

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Abstract

We demonstrate nanoscale resolved mapping of nanoparticle near-fields, surface polaritons and a SiC superlens by employing scattering-type near-field optical microscopy. Interferometric detection thereby yields both the local near-field optical amplitude and phase.

© 2007 Optical Society of America

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