Abstract
Reacting silicon surfaces in contact with the glow discharge of SiH4 or SiH4+CH4 have been studied by an FT-IR-ATR (Attenuated Total Reflection) technique. In the early stages of silicon film growth from a SiH4 plasma at a substrate temperature of 200°C, SiH2 is the major species on the surface, while at room temperature SiH3 and (SiH2)n chains are the dominant surface products. At a temperature of -95 °C, polymerization reactions among adsorbates proceeds on the surface to form polysilane. At the beginning of silicon carbide deposition on a silicon film from a SiH4+CH4 plasma, the surface hydrogen bonds are scavenged by CH3 radicals at room temperature, while they are stable at temperatures below -50°C.
© 1995 Optical Society of America
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