Second Harmonic Spectroscopy of Buried Si(001)/SiO2 Interfaces and Si(001) Epitaxial Growth Surfaces

Michael Downer

doi:10.1364/NLO.1996.NWC.1

Nonlinear Optics: Materials, Fundamentals and Applications
Technical Digest Series (Optica Publishing Group, 1996),
paper NWC.1
•https://doi.org/10.1364/NLO.1996.NWC.1

Second Harmonic Spectroscopy of Buried Si(001)/SiO₂ Interfaces and Si(001) Epitaxial Growth Surfaces

Michael Downer

Nonlinear Optics: Materials, Fundamentals and Applications 1996

Maui, Hawaii United States
8–12 July 1996
ISBN:

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Nonlinear Probes of Materials and Devices (NWC)

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M. Downer, "Second Harmonic Spectroscopy of Buried Si(001)/SiO2 Interfaces and Si(001) Epitaxial Growth Surfaces," in Nonlinear Optics: Materials, Fundamentals and Applications, Technical Digest Series (Optica Publishing Group, 1996), paper NWC.1.

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