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Conferences > NLO > 2004 > WD > WD19

Characterization of a microspherical cavity with a stem by observing resonantly scattered far-field incident light

Hideaki Takashima, Akito Chiba, Hideki Fujiwara, Jun-ichi Hotta, Shigeki Takeuchi, and Keiji Sasaki

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Abstract

A simple method to evaluate silica microspheres with stem without evanescent couplers is proposed. Comparing the observed resonant peaks to calculations, the radius of the sphere is determined with the precision of 10 nm.

© 2004 Optical Society of America

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