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Conferences > NLO > 2011 > NMD > NMD5

3D Knife-edge Characterization of Two-Photon Absorption Volume in Silicon for Integrated Circuit Testing

K. Shao, V. Pouget, E. Faraud, C. Larue, D. McMorrow, and D. Lewis

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Abstract

We have performed three-dimensional characterization of the TPA effective laser spot size in silicon using an integrated knife-edge sensor. The TPA-induced response of a CMOS integrated circuit is analyzed based on these results.

© 2011 Optical Society of America

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