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Numerically Processed Interferometric Nonlinear Refractive Index Measurements at 3240 nm

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Abstract

We developed an interferometric technique for measuring the nonlinear refrac- tive index of optical materials with included experimental temporal and spatial intensity profiles. We present measurements of ZnSe, GaSe, AGS and SBN samples at 3240 nm.

© 2021 The Author(s)

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THA6 Conference on Laser and Electrooptical Systems (CLEO:S&I) 1976

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