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Nonlinear optical characterization of deuterated silicon-rich nitride waveguides

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Abstract

Nonlinear optical characterization of Silicon-Rich Nitride waveguides fabricated using deuterated silane are presented. Fourier Transform Infrared Spectroscopy reveals the absence of Si-H and N-H related bonds known to cause optical absorption close to a wavelength of 1550nm.

© 2021 The Author(s)

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