A Comprehensive Approach to the Nonlinear Optical Characterization of Si and GaAs in the Near-Infrared Spectral Region

Joel M. Hales; Joel M. Hales; Natalia Munera; Sepehr Benis; San-Hui Chi; Joseph W. Perry; Dale McMorrow; David J. Hagan; Eric W. Van Stryland

doi:10.1364/NLO.2021.NTu2B.2

OSA Nonlinear Optics 2021
OSA Technical Digest (Optica Publishing Group, 2021),
paper NTu2B.2
•https://doi.org/10.1364/NLO.2021.NTu2B.2

A Comprehensive Approach to the Nonlinear Optical Characterization of Si and GaAs in the Near-Infrared Spectral Region

Joel M. Hales, Natalia Munera, Sepehr Benis, San-Hui Chi, Joseph W. Perry, Dale McMorrow, David J. Hagan, and Eric W. Van Stryland

Nonlinear Optics 2021

Washington, DC United States
9–13 August 2021
ISBN: 978-1-943580-97-2

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Topological and Nonlinear Materials (NTu2B)

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J. M. Hales, N. Munera, S. Benis, S. Chi, J. W. Perry, D. McMorrow, D. J. Hagan, and E. W. Van Stryland, "A Comprehensive Approach to the Nonlinear Optical Characterization of Si and GaAs in the Near-Infrared Spectral Region," in OSA Nonlinear Optics 2021, R. Boyd, C. Conti, D. Christodoulides, and P. Rakich, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper NTu2B.2.

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Abstract

The third-order nonlinear optical coefficients of Si and GaAs have been characterized in the near-infrared using a comprehensive approach to ensure accuracy and to address the large variation in the published coefficients.

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