Abstract
Glancing-angle–deposited MgO films are characterized using ellipsometry, scanning-electron microscopy, 351-nm photometry, and retardance mapping. Development of a quantitative model remains a challenge, with progress and empirical results reported.
© 2016 Optical Society of America
PDF ArticleMore Like This
S. MacNally, C. Smith, J. Spaulding, J. Foster, and J. B. Oliver
MD.2 Optical Interference Coatings (OIC) 2019
J. B. Oliver, T. J. Kessler, C. Smith, B. Taylor, V. Gruschow, J. Hettrick, B. Charles, J. Spaulding, T. Noll, A. L. Rigatti, S. Papernov, K. A. Sharma, G. Mitchell, and J. Foster
NS4B.1 Novel Optical Materials and Applications (NOMA) 2015
W. Trottier-Lapointe, O. Zabeida, T. Schmitt, and L. Martinu
FB.4 Optical Interference Coatings (OIC) 2016