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Conferences > NPIS > 2005 > NThA > NThA6

Analysis of polarization-dependent near-field optical effects in microfabricated apertureless SNOM probes

Wataru Nakagawa, Luciana Vaccaro, Emiliano Descrovi, and Hans Peter Herzig

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Abstract

We investigate the influence of single and multiple defects in the metal coating layer of microfabricated apertureless scanning near-field optical microscopy (SNOM) probes on the polarization-dependent emitted optical near field using rigorous electromagnetic modeling tools.

© 2005 Optical Society of America

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