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Direct aberrations correction in two photon microcopy by a single on-axis measurement

Rodrigo Aviles-Espinosa, Jordi Andilla, Rafael Porcar-Guezenec, Omar Olarte, Xavier Levecq, David Artigas, and Pablo Loza-Alvarez

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Abstract

The use of the nonlinear guide-star concept is proposed. This principle is used to directly measure sample aberrations employing a wave front sensor and correcting them in a single step by shaping a deformable mirror.

© 2011 Optical Society of America

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