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Conferences > NTM > 2013 > NM4B > NM4B.1

Nonlinear Structured Illumination Microscopy with Surface Plasmon Resonance Enhanced Stimulated Emission Depletion

Han Zhang, Ming Zhao, and Leilei Peng

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Abstract

We report a nonlinear SIM method that utilizes the nonlinearity of stimulated emission depletion (STED) effect to break the diffraction limit, and surface plasmon resonance (SPR) to enhance STED field and improve resolution.

© 2013 Optical Society of America

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