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Conferences > NTM > 2017 > NS1C > NS1C.5

Multi-pass phase microscopy

Brannon B. Klopfer, Thomas Juffmann, and Mark A. Kasevich

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Abstract

Multi-pass microscopy is a tool for high sensitivity, low damage microscopy. Sensitivity enhancement in both polarization and absorption microscopy has been demonstrated. Here we discuss multi-pass phase microscopy and its applicability to cell imaging.

© 2017 Optical Society of America

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