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Conferences > NTM > 2021 > NF2C > NF2C.5

Deep learning in frequency space enables sample-independent parameter estimation in Fourier ptychographic microscopy

Suyog Jadhav and Florian Ströhl

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Abstract

Parameter estimation is crucial for phase retrieval in Fourier ptychographic microscopy. We cast this task as object detection problem in frequency space, thus permitting the use of a neural network that performs with unprecedented accuracy.

© 2021 The Author(s)

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