Abstract
We have investigated the photon-surface plasmon polariton coupling efficiency of SiO2-Ag-AI2O3-AI and SiO2-AI2O3-AI junctions as a function of grating parameters and dielectric coatings on the diffraction spectra. At optimum coupling conditions surface plasmon polariton enhanced photoconductivity was detected. The color sensitivity of MOM junctions was varied over the whole visible range with different dielectric coatings. Sensitivities of up to 0.5 V/W are achieved using suitable geometries and oxide design. These detectors are capacitance-limited and could detect signals below 10 ps. In addition the emission characteristic of SiO2-Ag-AI2O3-AI junction at optical frequencies has been investigated.
© 1985 Optical Society of America
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