Abstract

Calculations of the reflectance, transmittance, Kerr magnetooptical polarization rotation, and related constants are important in the design of multilayer thin-film media for magnetooptical disks for data storage. Different methods have been suggested in the literature for specific structures. Based on the approximations suggested by Tomita and Yoshino¹ and using the characteristic matrix methods² for thin films, a powerful technique has been established and a computer program to calculate all the optical responses of the multilayer structure has been written. Calculations for a few specific models have been made and these predict Kerr rotation angles >2° for normal incidence and for an optimum magnetic film thickness of ~10 nm. The effect of a dielectric overcoat is also studied. The technique can be readily extended to different media structures and oblique incidence calculations can also be incorporated. We feel that design criteria for the disk media can be analyzed very effectively with this technique.

© 1986 Optical Society of America