Dispersion properties of four-layer thin-film waveguides: theoretical analysis

Daniel W. Hewak; John W. Y. Lit

doi:10.1364/OAM.1986.THG5

Annual Meeting Optical Society of America
Technical Digest Series (Optica Publishing Group, 1986),
paper THG5
•https://doi.org/10.1364/OAM.1986.THG5

Dispersion properties of four-layer thin-film waveguides: theoretical analysis

Daniel W. Hewak and John W. Y. Lit

OSA Annual Meeting 1986

Seattle, Washington United States
19–25 October 1986
ISBN:

From the session
Integrated Optics: 1 (THG)

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D. W. Hewak and J. W. Y. Lit, "Dispersion properties of four-layer thin-film waveguides: theoretical analysis," in Annual Meeting Optical Society of America, Technical Digest Series (Optica Publishing Group, 1986), paper THG5.

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Abstract

The guiding properties of a four-layer planar waveguide can be described by an effective index of refraction N. This effective index will vary with external changes such as temperature, wavelength, electric field, etc. By differentiating the characteristic equation¹ and introducing new normalized parameters, explicit expressions for the dispersion properties of the TE and TM modes have been derived.

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