Infrared Talbot deflection interferometry and its uses

Xin Yu; Wanlin Ming

doi:10.1364/OAM.1987.MV5

Annual Meeting Optical Society of America
Technical Digest Series (Optica Publishing Group, 1987),
paper MV5
•https://doi.org/10.1364/OAM.1987.MV5

Infrared Talbot deflection interferometry and its uses

Xin Yu and Wanlin Ming

OSA Annual Meeting 1987

Rochester, New York United States
18–23 October 1987
ISBN:

From the session
Interferometry: 2 (MV)

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X. Yu and W. Ming, "Infrared Talbot deflection interferometry and its uses," in Annual Meeting Optical Society of America, Technical Digest Series (Optica Publishing Group, 1987), paper MV5.

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Abstract

Talbot deflection interferometry has recently been widely used for collimating light beams, measuring focal length, birefringence and phase object, determining temperature field and density field of a transparent medium, etc.

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