Abstract

Fourier transform spectroscopy dominates the field of infrared high resolution spectroscopy; however, in many low temperature sources the line profile can be smaller than the instrumental profile producing heavily distorted spectra. The instrumental profile of FT IR instruments is a modified sine function and can greatly complicate the reduction of data taken with Fourier transform spectrometers. A technique for achieving modest resolution enhancement has been developed by modifying a nonlinear line profile fitting algorithm to fit only the spectral components present in the spectrum.

© 1989 Optical Society of America