Abstract

The polarization characteristics of speckle patterns scattered from rough conductors¹ are analyzed theoretically and experimentally. The analysis leads to a new measuring procedure where the complex amplitudes of the polarization components can be correlated. This procedure is substantially different from conventional methods where only intensity correlations could be measured. Unlike previously employed methods, here no a priori assumption of Gaussian distributions is necessary. Laboratory measurements performed on specially prepared samples are in excellent agreement with computer simulations and and mechanical measurements. The results of this work indicate good potential for use in noncontact evaluation of material surface quality.

© 1989 Optical Society of America