Abstract

A reflection-mode polymeric interference modulator is used to measure the linear electrooptic (EO) coefficients of a second-order nonlinear polymeric film. The reflection-mode interference modulator is a stratified structure consisting of a partial reflecting conducting layer, an EO layer, and a highly reflecting conducting layer. At resonance, the reflected light intensity is modulated through the linear EO effect by a modulating voltage applied across the conducting layers. The linear and modulated reflectance characteristics are modeled by anisotropic stratified transfer matrix methods with a high degree of accuracy. From reflectance and modulated reflectance measurements as a function of the angle in incidence, both the linear and nonlinear properties of the nonlinear film can be determined. Using this technique dispersion measurements of the nonlinear EO coefficients can be performed using a broadband incoherent source. This measurement technique is used to characterize the linear EO coefficients of poled polymeric thin films.

© 1991 Optical Society of America