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Is the hole mobility proportional to the dc dielectric constant in photorefractive BaTiO3?

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Abstract

According to the band-conduction model the erasure rate Γ of a photorefractive grating is given by where e is the electric charge, μm is the carrier mobility, and ε the dielectric constant along the direction of charge migration, n0 is the density of free carriers, and f(kg, ε) is a function that is nearly unity for small grating wavevector kg. Because both the dielectric constant and the free-carrier mobility vary with direction in a BaTiO3 crystal, the erasure rate Γ∝μ/ε of a photorefractive grating is also expected to depend strongly on the grating’s orientation. In fact, we find that it does not. Previous work1 showed that pm/e is approximately independent of direction at T = 25 °C. To study μm/ε with ε changing, we heated a type A crystal2 of BaTiO3 from T = 16°C to 45°C. Over this range ε decreases by 40%, while ε|| increases by 20%. We find that the rates are the same for both grating orientations in spite of the different temperature dependencies of ε and ε||.

© 1991 Optical Society of America

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