Abstract
This paper proposes and analyzes a technique that will allow the spatial coherence properties of short-wavelength radiation sources to be measured. The technique is based on the analysis of the partially coherent diffraction patterns produced by a uniformly redundant array. The technique is particularly suited to short pulse sources and allows, assuming a Schell model for the mutual intensity function, a complete determination of the complex coherence factor for the radiation. Some measurements of the spatial coherence of the Se soft x-ray laser at the Lawrence Livermore National Laboratory are presented.
© 1991 Optical Society of America
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