Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Photorefractive adaptive autocorrelation measurements of surface roughness

Not Accessible

Your library or personal account may give you access

Abstract

We show that adaptive optical autocorrelation can be used to measure the typical grain size of a rough surface. According to second-order statistics,1 the autocorrelation of the optical image of a surface provides a measurement of its grain size. This grain size may be found from the ratio of the peak (de) intensity to the broad background intensity in the autocorrelation. A photorefractive autocorrelator may be made by modifying a four-wave mixing correlator.2 A beam bearing an image of the rough surface is presented as one input to a correlator using bismuth germanate (BGO) in the Fourier plane. After passage through the BGO, this beam is phase conjugated by a barium titanate crystal. The resulting complex conjugate of the image beam is presented automatically self-aligned as the second input. The third input is a plane wave in the Fourier plane. The output of the device is the autocorrelation of the constant amplitude, phase modulated surface image. This autocorrelation consists of a sharp (de component) surrounded by a broad low-intensity background of the cross correlation of the rough surface.3 The ratio of the de component to the cross correlation component is used to determine the surface roughness properties. Care was taken to capture all of the diffracted light from the surface to avoid finite aperture effects.4 The autocorrelator measurements agree with microscopic surface measurements.

© 1991 Optical Society of America

PDF Article
More Like This
Surface roughness measurement using an inexpensive laser diode source

Abdul Ahad S. Awwal, Hadi Kaftan, L. Li, and Jamal U. Ahmed
ThMM51 OSA Annual Meeting (FIO) 1991

Coating and substrate surface roughness

K. H. Guenther, M. M. Tehrani, and Jean M. Bennett
TuF5 OSA Annual Meeting (FIO) 1991

Polarized images of radiation scattered from objects with randomly rough surfaces

Chang-Hyuk and Kyle J. Zeringue
ThMM54 OSA Annual Meeting (FIO) 1991

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.