High temperature optical characterization of CVD diamond

J. R. McNeely; M. A. Akerman; R.E. Clausing; M. B. McIntosh; W. Snyder; Michael E. Thomas; M. J. Linevsky

doi:10.1364/OAM.1992.PD30

Optical Society of America Annual Meeting
Technical Digest Series (Optica Publishing Group, 1992),
paper PD30
•https://doi.org/10.1364/OAM.1992.PD30

High temperature optical characterization of CVD diamond

J. R. McNeely, M. A. Akerman, R.E. Clausing, M. B. McIntosh, W. Snyder, Michael E. Thomas, and M. J. Linevsky

OSA Annual Meeting 1992

Albuquerque, New Mexico United States
20–25 September 1992
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J. R. McNeely, M. A. Akerman, R. E. Clausing, M. B. McIntosh, W. Snyder, M. E. Thomas, and M. J. Linevsky, "High temperature optical characterization of CVD diamond," in Optical Society of America Annual Meeting, Technical Digest Series (Optica Publishing Group, 1992), paper PD30.

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Abstract

The optical transmittance, reflectance, and scatter characteristics of thin, polished free-standing chemical vapor deposition (CVD) diamond films were measured at room temperature and 500 C.

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