Abstract
A new class of distributed-feedback semiconductor lasers termed "concentric-circle-grating, surface-emitting" (CCGSE) lasers has recently been demonstrated.1 Fabricating gratings of the quality needed to produce lasing in well behaved circularly symmetric modes is a challenging problem. We compare here two methods of pattern definition by electron-beam lithography and examine their effects on the performance of CCGSE lasers. We explore issues such as uniformity of both the grating linewidth and periodicity. These features are found to have the greatest effect on the spatial character of the lasing mode.
© 1992 Optical Society of America
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