Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Coherence measurement of bright x-ray beams by intensity interferometry

Not Accessible

Your library or personal account may give you access

Abstract

Intensity interferometry1,2 is potentially suited to measuring the coherence of an x-ray beam produced by a high brightness source and, thereby, to measuring the size of the source itself.

© 1993 Optical Society of America

PDF Article
More Like This
Thermal distortion effects on optical substrates that reduce coherence properties of Undulator beamlines

Raul Beguiristain
TuD.6 Soft X-Ray Projection Lithography (SXRAY) 1993

Intense Monochromatic Point X-Ray Source Produced by a Short-Pulse Laser and its Applications to Holographic Imaging

M. S. Schulz, H. Daido, G. M. Zeng, M. Nakatsuka, Y. Kato, S. Nakai, I. C. E. Turcu, I. N. Ross, and A. Hening
XRLAXR223 Shortwavelength V: Physics with Intense Laser Pulses (HFSW) 1993

Observation of coherent x-ray scattering at grazing incidence

Z.H. Cai, B. Lai, W.B. Yun, I. McNulty, K.G. Huang, and T.P. Russell
FO.6 OSA Annual Meeting (FIO) 1993

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.