Improved wavelength measurements in bismuth and neon with a Fourier-transform spectrometer

Simon George; Mansour Mehdad; Rolf Engleman; Rolf Engleman

doi:10.1364/OAM.1993.FR.6

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper FR.6
•https://doi.org/10.1364/OAM.1993.FR.6

Improved wavelength measurements in bismuth and neon with a Fourier-transform spectrometer

Simon George, Mansour Mehdad, and Rolf Engleman

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

From the session
Symposium on Space Based Optics in the 21st Century: 2 (FR)

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S. George, M. Mehdad, and R. Engleman, "Improved wavelength measurements in bismuth and neon with a Fourier-transform spectrometer," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper FR.6.

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Abstract

The ultra violet and visible emission spectrum of Bi I has been analyzed using data obtained from the Fourier Transform Spectrometer located at Kitt Peek National Observatory in Arizona.

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