Z-scan technique using top-hat beams

W. Zhao; P. Palffy-Muhoray

doi:10.1364/OAM.1993.MHH.1

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper MHH.1
•https://doi.org/10.1364/OAM.1993.MHH.1

Z-scan technique using top-hat beams

W. Zhao and P. Palffy-Muhoray

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

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Nonlinear Materials and Measurement (MHH)

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W. Zhao and P. Palffy-Muhoray, "Z-scan technique using top-hat beams," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper MHH.1.

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Abstract

The Z-scan technique developed by Sheik-Bahae¹ is straightforward method of accurately measuring intensity dependent optical nonlinearities of materials.

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