Improved Z-scan techniques for ultrasensitive measurements of nonlinear refraction and absorption

T. Xia; A.A. Said; M. Sheik-Bahae; F. Senesi; C. Wamsley; D.J. Hagan; E.W. Van Stryland

doi:10.1364/OAM.1993.MHH.2

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper MHH.2
•https://doi.org/10.1364/OAM.1993.MHH.2

Improved Z-scan techniques for ultrasensitive measurements of nonlinear refraction and absorption

T. Xia, A.A. Said, M. Sheik-Bahae, F. Senesi, C. Wamsley, D.J. Hagan, and E.W. Van Stryland

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

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Nonlinear Materials and Measurement (MHH)

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T. Xia, A. A. Said, M. Sheik-Bahae, F. Senesi, C. Wamsley, D. J. Hagan, and E. W. Van Stryland, "Improved Z-scan techniques for ultrasensitive measurements of nonlinear refraction and absorption," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper MHH.2.

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Abstract

Z-scan is a method for measuring both nonlinear refraction and absorption using a single beam. Changes in transmission of the beam through a far-field, on-axis aperture are measured as the sample is scanned through the focal plane[1].

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