Determination of the electron transition moment of the SiH (A2Δ-X2Π) band system determined by recording of shock-excited spectra with an optical multichannel analyzer

Joseph B. Shin; Jin. Z. Shen; Mark W.P. Cann; Ralph W. Nicholls

doi:10.1364/OAM.1993.MR.2

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper MR.2
•https://doi.org/10.1364/OAM.1993.MR.2

Determination of the electron transition moment of the SiH (A²Δ-X²Π) band system determined by recording of shock-excited spectra with an optical multichannel analyzer

Joseph B. Shin, Jin. Z. Shen, Mark W.P. Cann, and Ralph W. Nicholls

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

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Molecular Spectroscopy (MR)

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J. B. Shin, J. Z. Shen, M. W. P. Cann, and R. W. Nicholls, "Determination of the electron transition moment of the SiH (A2Δ-X2Π) band system determined by recording of shock-excited spectra with an optical multichannel analyzer," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper MR.2.

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Abstract

Band systems of the astrophysically important molecules SiH and SiN have been excited by shock excitation of silane/N2 mixtures. Spectra were digitally recorded by use of an optical multichannel analyzer. They were analyzed by comparison with spectra produced by realistic numerical synthesis methods. Data for the SiH (A2Δ–X2Π) system will be presented. They include band-strengths and the variation of the electronic transition moment with wavelength and internuclear separation. This work has been supported by research grants from Natural Sciences and Engineering Research Council of Canada.

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