Statistical phase excursions in image-plane interferometry

Sudhakar Prasad

doi:10.1364/OAM.1993.ThMM.6

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper ThMM.6
•https://doi.org/10.1364/OAM.1993.ThMM.6

Statistical phase excursions in image-plane interferometry

Sudhakar Prasad

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

From the session
Aero-Optics (ThMM)

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S. Prasad, "Statistical phase excursions in image-plane interferometry," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper ThMM.6.

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Abstract

Ground-based interferometry suffers principally from atmospheric phase corruption that is quite large in the pupil plane for large aperture sizes and separations.

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