Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Results of atom-interferometry experiments with potassium

Not Accessible

Your library or personal account may give you access

Abstract

Results of high flux atom interferometry experiments with potassium in generalized Talbot-vonLau configurations are presented. The interferometer consists of a sequence of three planar vacuum slit diffraction gratings, microfabricated from silicon nitride membranes. Interference fringes are sensed by measuring the transmission of atoms on a hot-wire as a function of grating relative position. Different spatial Fourier components (up to fifth) in the diffraction pattern are resonant in the interferometer at different atomic velocities. When a laser cooled slow beam is incident, various different diffraction patterns are observed as a function of atomic velocity, selected via the tuning of D2 cooling lasers. In an alternative “Heisenberg Microscope” configuration an incident thermal beam produces a velocity average over different fringe Fourier components. Fringe patterns for each HFS component are revealed by their selective destruction by AC modulated weak Dl laser light passing through the interferometer near the middle grating. Since imaging of the fluorescent light could determine which slit an atom passes, the laser removes the fringe pattern contribution by Doppler shifted atoms at its wavelength. That contribution is thus AC modulated and detected. Shifts of the patterns by gravity and rotation are evident when the vacuum chamber is tilted.

© 1993 Optical Society of America

PDF Article
More Like This
“Heisenberg microscope” decoherence atom interferometry1

Shifang Li and John F. Clauser
QPD1 International Quantum Electronics Conference (IQEC) 1994

Precision measurements with atom interferometry

Steven Chu, David Weiss, and Brent Young
QMF4 Quantum Electronics and Laser Science Conference (CLEO:FS) 1993

Experiments with a separated-beam atom interferometer

David E. Pritchard, C. Ekstrom, J. Schmiedmayer, M. Chapman, and T. Hammond
ThOO.1 OSA Annual Meeting (FIO) 1993

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.