Microdisk-laser linewidths near threshold

U. Mohideen; R. E. Slusher; S. L. McCall; F. Jahnke; S. W. Koch

doi:10.1364/OAM.1993.WN.4

OSA Annual Meeting
Technical Digest Series (Optica Publishing Group, 1993),
paper WN.4
•https://doi.org/10.1364/OAM.1993.WN.4

Microdisk-laser linewidths near threshold

U. Mohideen, R. E. Slusher, S. L. McCall, F. Jahnke, and S. W. Koch

OSA Annual Meeting 1993

Toronto Canada
3–8 October 1993
ISBN:

From the session
Joint Symposium on Microcavity Lasers: 1 (WN)

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U. Mohideen, R. E. Slusher, S. L. McCall, F. Jahnke, and S. W. Koch, "Microdisk-laser linewidths near threshold," in OSA Annual Meeting, Technical Digest Series (Optica Publishing Group, 1993), paper WN.4.

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Abstract

Semiconductor microdisks form high Q, low volume microcavities with diameters between 2 and 5μm and thicknesses near 0.1 μm.

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