Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > OAM > 1993 > WPP > WPP.5

Sensitivity of reflection, transmission, and ellipsometric measurements to dispersion, inhomogeneity, and surface roughness

R. F. Edgerton

Open Access Open Access

Abstract

A comprehensive model describing many of the features observed in real TiO2 films was used to compute spectroscopic polarimetry data.

© 1993 Optical Society of America

PDF Article
More Like This
Characterization of Inhomogeneous and Absorbing Thin Films by Combined Spectroscopic Ellipsometry/ Reflection, and Transmission Measurements

Blaine Johs, D. Meyer, John A. Woollam, J.F. Elman, T.E. Long, and J.T. Koberstein
OThE8 Optical Interference Coatings (OIC) 1992

In situ ellipsometric study of the growth of dielectric thin films

J. Rivory, S. Fisson, V. Nguyen van, Ph. Roisin, G. Vuye, Y. Wang, and F. Abelès
WPP.2 OSA Annual Meeting (FIO) 1993

Dispersion of linear and nonlinear quadratic optical properties of electrooptic polymers by spectroscopic ellipsometry

E. Toussaere and J. Zyss
WA.1 Organic Thin Films for Photonic Applications (OTF) 1993

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use