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Systematic Phase Transformation Kinetics Measurements -Crystallization and Critical Quench Rates of The Binary Te-Ge System

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Abstract

Phase-change optical recording requires media which can be reversibly transformed between the amorphous and crystalline states. Previous workers have described the laser pulse conditions which cause amorphization or crystallization of thin film alloys to occur 1-5. We have continued to develop the technique which we call Phase Transformation Kinetics (PTK), which extends the previous work significantly6. A single PTK diagram shows the laser pulse conditions which cause phase transformations to occur. It is used to quantitatively compare the transformation kinetics of different materials.

© 1985 Optical Society of America

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