Abstract

Amorphous ferrimagnetic rare-earth transition metal (RETM) thin films are considered to be potential candidate materials for magneto-optic (MO) recording applications [1-3]. These films are grown to have a perpendicular uniaxial anisotropy, such that the net magnetization lies normal to the film plane [4,5]. Recently, investigators have reported superior magnetic properties for artificially layered RETM structures grown by dc-sputtering [6].

© 1987 Optical Society of America