EDFA Gain and Noise Figure Test Method for WDM Applications

Kazuo Aida; Kiyoshi Nakagawa

First Optoelectronics and Communications Conference
Technical Digest Series (Optica Publishing Group, 1996),
paper 17B3.4

EDFA Gain and Noise Figure Test Method for WDM Applications

Kazuo Aida and Kiyoshi Nakagawa

Optoelectronics and Communications Conference 1996

Chiba Japan
16–19 July 1996
ISBN:

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WDM Technologies (17B3)

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K. Aida and K. Nakagawa, "EDFA Gain and Noise Figure Test Method for WDM Applications," in First Optoelectronics and Communications Conference, Technical Digest Series (Optica Publishing Group, 1996), paper 17B3.4.

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Abstract

A method for testing EDFA under the simultaneous input of multi-wavelength signals is presented; the ASE power in each WDM channel is separately detected in the time domain using pulsed signals.

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