Characterization of Integrated Photonic Circuits with Ultrahigh Resolution Using Swept Optical Single Sideband Modulation (Invited)

Shilong Pan; Min Xue

doi:10.1364/OEDI.2015.OT2C.2

International Photonics and OptoElectronics
OSA Technical Digest (online) (Optica Publishing Group, 2015),
paper OT2C.2
•https://doi.org/10.1364/OEDI.2015.OT2C.2

Characterization of Integrated Photonic Circuits with Ultrahigh Resolution Using Swept Optical Single Sideband Modulation (Invited)

Shilong Pan and Min Xue

Optoelectronic Devices and Integration 2015

Wuhan China
16–19 June 2015
ISBN: 978-1-943580-01-9

From the session
Integrated Photonics (OT2C)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
S. Pan and M. Xue, "Characterization of Integrated Photonic Circuits with Ultrahigh Resolution Using Swept Optical Single Sideband Modulation (Invited)," in International Photonics and OptoElectronics, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper OT2C.2.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

The recent progress in developing optical vector analysis based on swept optical single-sideband modulation for measuring the magnitude and phase responses of photonic integrated circuits is reviewed and the prospective of the technique is discussed.

PDF Article

More Like This

Optical Vector Analysis with Ultra-high Resolution

Shilong Pan and Min Xue
W4K.1 Optical Fiber Communication Conference (OFC) 2016

High Resolution Optical Phase Response Measurement Using Single Sideband Modulation

D.B. Adams and C.K. Madsen
JThA22 National Fiber Optic Engineers Conference (NFOEC) 2008

Optical Single-Sideband Modulation Based on Stimulated Brillouin Scattering

Di Zheng, Wei Pan, Xihua Zou, Weili Zhang, and Xinkai Liu
ASu4H.3 Asia Communications and Photonics Conference (ACP) 2015

Previous Article Next Article