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Hybrid Integration of an InGaAs/InP PIN Photodiode with an Ultrafast Sampling Circuit

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Abstract

The demand for high speed optical measurement techniques has been growing rapidly as the operating bandwidth of optoelectronic devices reaches well into the GHz regime. In order to measure ultrafast signals, complex autocorrelation and deconvolution techniques or expensive streak cameras are commonly employed. This paper describes operation of an alternative and less complex means of ultrafast optical measurement technique involving the integration of a high speed InGaAs/InP PIN photodiode with a GaAs non-linear transmission line (NLTL) sampling circuit in which the measured system response is as low as 4.1 ps FWHM.

© 1991 Optical Society of America

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