Abstract
Semiconductor optical amplifiers (SOA’s) are useful for many high-speed system applications, including special functional circuits at the transmitter and receiver ends.1,2 To fully evaluate the temporal response and speed limitations of optical amplifiers, very-high-data-rate optical test patterns are needed. Repetitive and modulated optical test patterns at bit rates up to 100 Gb/s were generated to study the high-speed characteristics of SOA’s from a gain-switched distributed-feedback (DFB) laser using optical spectral filtering,3 chirp compression,4 and optical time-division multiplexing (OTDM).5
© 1991 Optical Society of America
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