Abstract
Recent advances in probe and feedback techniques have brought near-field scanning microscopy (NSOM) to the point where it can be routinely applied to a variety of systems.1 Although many efforts are directed at improving the current spatial resolution of ~12 nm of the current probe designs, the diversity of applications would be greatly increased by the development of a near-field probe with greatly improved photon flux.
© 1994 Optical Society of America
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