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Optica Publishing Group
  • Optical Fiber Communication Conference
  • Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper MF30

A complete internal mechanical stress analysis of multilayer composite leads to optimized coating process control for 50GHz thin film filters

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Abstract

Internal stress simulation of a multilayer structure using measured wafer curvature accurately predicts the central wavelength shifts and spectrum ripple resulting from grinding and temperature change, thereby greatly improving the production yield of 50GHz filters.

© 2004 Optical Society of America

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