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First 80-Gb/s and 160-Gb/s Wavelength-Converted Data Stream Measurements in a Silicon Waveguide

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Abstract

Data fidelity is inspected for the first time for wavelength-converted RZ TDM 80- and 160-Gb/s data using four-wave mixing in a silicon waveguide. Open eye diagrams and error-free operation is shown for demultiplexed 10-Gb/s tributaries.

© 2010 IEEE Communications Society, IEEE Photonics Society, OSA, Telcordia

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