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Integrated in-band optical signal-to-noise ratio (OSNR) monitor implemented in SOI platform

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Abstract

Based on the different coherence properties of signal and noise, we measured the inband optical signal-to-noise ratio using integrated thermally tunable Mach-Zehnder optical delay interferometer in SOI platform. The experimental results show good bit-rate-independent property.

© 2012 Optical Society of America

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